Skip Nav Destination
Article navigation
Volume 91, Issue 6
15 March 2002
- Previous Article
- Next Article
Research Article| March 15 2002
Tsung-Hsing Yu;
Tsung-Hsing Yu
School of Electrical and Computer Engineering, Georgia Tech, Atlanta, Georgia 30332-0250
Search for other works by this author on:
This Site
Kevin F. Brennan
Kevin F. Brennan
School of Electrical and Computer Engineering, Georgia Tech, Atlanta, Georgia 30332-0250
Search for other works by this author on:
This Site
J. Appl. Phys. 91, 3730–3736 (2002)
Article history
Received:
November 15 2001
Accepted:
December 12 2001
-
- Views Icon Views
- Article contents
- Figures & tables
- Video
- Audio
- Supplementary Data
- Peer Review
- Tools Icon Tools
Cite Icon Cite
- Search Site
Citation
Tsung-Hsing Yu, Kevin F. Brennan; Monte Carlo calculation of two-dimensional electron dynamics in GaN–AlGaN heterostructures. J. Appl. Phys. 15 March 2002; 91 (6): 3730–3736. https://doi.org/10.1063/1.1448889
Download citation file:
- Ris (Zotero)
- Reference Manager
- EasyBib
- Bookends
- Mendeley
- Papers
- EndNote
- RefWorks
- BibTex
We present detailed Monte Carlo based calculations of the electron dynamics in GaN–AlGaN heterostructures in the presence of strain polarization fields. The model consists of a fully numerical self-consistent solution of the Schrödinger–Poisson equation with a Monte Carlo transport model. The two-dimensional sub-band energies, wave functions and carrier scattering mechanisms are computed numerically and included within a Monte Carlo simulation. The electron energy, steady-state and transient drift velocity and band occupancy are calculated as a function of electric field for different AlGaN–GaN heterostructure compositions. The effect of piezoelectrically induced strain fields on the transport dynamics is examined. A field dependent mobility model is also developed from the Monte Carlo results.
REFERENCES
1.
2.
R. J. Trew, in Semiconductors and Semimetals, Vol. 52, edited by R. K. Willardson and A. C. Beer (Academic, New York, 1998), p. 237
3.
4.
5.
6.
O. Ambacher B. Foutz J. Smart J. R. Shealy N. G. Weimann K. Chu M. Murphy A. J. Sierakowski W. J. Schaff L. F. Eastman R. Dimitrov A. Mitchell M. Stutzmann
J. Appl. Phys.
87
,
334
(
2000
).
7.
Q. Chen J. W. Yang R. Gaska M. A. Khan M. S. Shur G. J. Sullivan A. L. Sailor J. A. Higgings A. T. Ping I. Adesida
IEEE Electron Device Lett.
19
,
44
(
1998
).
8.
Y-F. Wu B. P. Keller P. Fini S. Keller T. J. Jenkins L. T. Kehias S. P. Denbaars U. K. Mishra
IEEE Electron Device Lett.
19
,
50
(
1998
).
9.
Y-F. Wu B. P. Keller S. Keller N. X. Nguyen M. Le C. Nguyen T. J. Jenkins L. T. Kehias S. P. Denbaars U. K. Mishra
IEEE Electron Device Lett.
18
,
438
(
1997
).
10.
M. J. Murphy K. Chu H. Wu W. Yeo W. J. Schaff O. Ambacher L. F. Eastman T. J. Eustis J. Silcox R. Dimitrov M. Stutzmann
Appl. Phys. Lett.
75
,
3653
(
1999
).
11.
K. F. Brennan E. Bellotti M. Farahmand J. Haralson P. P. Ruden J. D. Albrecht A. Sutandi
Solid-State Electron.
44
,
195
(
2000
).
12.
K. F. Brennan E. Bellotti M. Farahmand H-E. Nilsson P. P. Ruden Y. Zhang
IEEE Trans. Electron Devices
47
,
1882
(
2000
).
13.
K. F. Brennan, J. Kolnik, I. H. Oguzman, E. Bellotti, M. Farahmand, P. P. Ruden, R. Wang and J. D. Albrecht, in GaN and Related Materials, Vol. 7, edited by S. J. Pearton (Gordon and Breach, Amsterdam, 2000), p. 305.
14.
E. Bellotti, M. Farahmand, M. Goano, E. Ghillino, C. Garetto, G. Ghione, H.-E. Nilsson, K. F. Brennan and P. P. Ruden, in Topics in High Field Transport in Semiconductors, edited by K. F. Brennan and P. P. Ruden (World Scientific, Singapore, 2001), p. 163.
15.
I. H. Oguzman E. Bellotti K. F. Brennan J. Kolnik R. Wang P. P. Ruden
J. Appl. Phys.
81
,
7827
(
1997
).
16.
E. Bellotti B. K. Doshi K. F. Brennan J. D. Albrecht P. P. Ruden
J. Appl. Phys.
85
,
916
(
1999
).
17.
M. Farahmand C. Garetto E. Bellotti K. F. Brennan M. Goano E. Ghillino G. Ghione J. D. Albrecht P. P. Ruden
IEEE Trans. Electron Devices
48
,
535
(
2001
).
18.
19.
20.
21.
22.
23.
24.
K. Tomizawa, Numerical Simulation of Submicron Semiconductor Devices, (Artech House, Boston, 1993).
25.
26.
27.
28.
29.
M. Goano E. Bellotti E. Ghillino G. Ghione K. F. Brennan
J. Appl. Phys.
88
,
6467
(
2000
).
30.
M. Goano E. Bellotti E. Ghillino G. Ghione K. F. Brennan
J. Appl. Phys.
88
,
6476
(
2000
).
31.
B. E. Foutz S. K. O’Leary M. S. Shur L. F. Eastman
J. Appl. Phys.
85
,
7727
(
1999
).
This content is only available via PDF.
© 2002 American Institute of Physics.
2002
American Institute of Physics
You do not currently have access to this content.
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Reset password
Register
Sign in via your Institution
Sign in via your Institution
Pay-Per-View Access
$40.00
Buy This Article
282 Views
81 Crossref
View Metrics
Citing articles via
Google Scholar
CrossRef (81)
Sign up for alerts
- Most Read
- Most Cited
Recent developments of quantum sensing under pressurized environment using the nitrogen vacancy (NV) center in diamond
A step-by-step guide to perform x-ray photoelectron spectroscopy
GaN-based power devices: Physics, reliability, and perspectives